THRESHOLD VOLTAGE FOR DAMAGE IN SI UNDER ELECTRON BOMBARDMENT.FRASER HL.1977; SCRIPTA METALLURG.; E.U.; DA. 1977; VOL. 11; NO 1; PP. 47-49; BIBL. 4 REF.Article

A TECHNIQUE FOR THE OBSERVATION OF RAPID SOLIDIFICATION AND ANNEALING OF POWDERS IN A TRANSMISSION ELECTRON MICROSCOPE = TECHNIQUE POUR L'OBSERVATION DE LA SOLIDIFICATION RAPIDE ET DU RECUIT DES POUDRES LORS D'UN EXAMEN PAR MICROSCOPIE ELECTRONIQUE A TRANSMISSIONKAUFMAN MJ; FRASER HL.1983; SCRIPTA METALLURGICA; ISSN 0036-9748; USA; DA. 1983; VOL. 17; NO 1; PP. 141-145; BIBL. 5 REF.Article

MICROSTRUCTURAL OBSERVATIONS OF METAL POWDERS USING ANALYTICAL ELECTRON MICROSCOPY.FIELD RD; FRASER HL.1978; METALLURG. TRANS. A; U.S.A.; DA. 1978; VOL. 9; NO 1; PP. 131-134; BIBL. 3 REF.Article

THE ORIGIN OF DISLOCATIONS WITH B=(100) IN SINGLE CRYSTALS OF BETA -NIAL COMPRESSED ALONG (001) AT ELEVATED TEMPERATURES.ZALUZEC NJ; FRASER HL.1974; SCRIPTA METALLURG.; E.U.; DA. 1974; VOL. 8; NO 9; PP. 1049-1053; BIBL. 11 REF.Article

THE EFFECT OF SPECIMEN THICKNESS ON X-RAY PROFILES IN STEMTWIGG ME; LORETTO MH; FRASER HL et al.1981; PHILOS. MAG., A; ISSN 0141-8610; GBR; DA. 1981; VOL. 43; NO 6; PP. 1587-1593; BIBL. 8 REF.Article

COMMENTS ON "ENERGY DISPERSIVE X-RAY MEASUREMENTS OF THIN METAL FOILS".ZALUZEC NJ; WOODHOUSE JB; FRASER HL et al.1977; SCRIPTA METALLURG.; E.U.; DA. 1977; VOL. 11; NO 4; PP. 257-259; BIBL. 8 REF.Article

CARBIDES IN ALLOYS OF VANADIUM.FLUHR CF; FRASER HL; WERT CA et al.sdIN: INT. CONF. STRENGTH MET. ALLOYS. 4. PROC.; NANCY; 1976; NANCY; ENSMIM-INPL; DA. S.D.; VOL. 2; PP. 727-730; BIBL. 5 REF.Conference Paper

LIMITING FACTORS IN SPECIMEN THICKNESS IN CONVENTIONAL AND SCANNING TRANSMISSION ELECTRON MICROSCOPY.FRASER HL; JONES IP; LORETTO MH et al.1977; PHILOS. MAG.; G.B.; DA. 1977; VOL. 35; NO 1; PP. 159-176; BIBL. 1 P.Article

AN ANALYTICAL ELECTRON MICROSCOPY STUDY OF THE HIGH TEMPERATURE CARBIDE FORMED IN A V-5 TI-C ALLOYBRUEMMER SM; FLUHR CP; BEGGS DV et al.1980; METALL. TRANS., A; USA; DA. 1980-05; VOL. 11A; NO 5; PP. 693-699; BIBL. 25 REF.Article

ANNEALING OF POINT DEFECTS IN QUENCHED NIALFRASER HL; LORETTO MH; SMALLMAN RE et al.1975; PHILOS. MAG.; G.B.; DA. 1975; VOL. 32; NO 4; PP. 873-875Article

STEM ANALYSIS OF GRAIN BOUNDARIES IN CEMENTED CARBIDES = ANALYSE MICROSCOPIQUE ELECTRONIQUE PAR TRANSMISSION DE JOINTS DE GRAINS DANS LES CARBURES CEMENTESSHARMA NK; WARD ID; FRASER HL et al.1980; J. AM. CERAM. SOC.; ISSN 0002-7820; USA; DA. 1980; VOL. 63; NO 3-4; PP. 194-196; BIBL. 12 REF.Article

AN ANALYTICAL ELECTRON MICROSCOPY STUDY OF THE HIGH TEMPERATURE CARBIDE FORMED IN A V-5 TI-C ALLOY = ETUDE ANALYTIQUE PAR MICROSCOPIE ELECTRONIQUE DU CARBURE FORME A HAUTE TEMPERATURE DANS UN ALLIAGE V-5 TI-CBRUEMMER SM; FLUHR CP; BEGGS DV et al.1980; METALL. TRANS. A; ISSN 0360-2133; USA; DA. 1980; VOL. 11; NO 5; PP. 693-699; BIBL. 25 REF.Article

SOLID-PHASE CRYSTALLIZATION OF SI FILMS IN CONTACT WITH AL LAYERS.HARRIS JM; BLATTNER RJ; WARD ID et al.1977; J. APPL. PHYS.; U.S.A.; DA. 1977; VOL. 48; NO 7; PP. 2897-2904; BIBL. 30 REF.Article